Effect of interface defects on the response time of superlattices
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,General Materials Science
Reference13 articles.
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2. Physical properties ofa-Si:H based compositional periodic multilayers;Physical Review B;1995-09-15
3. Carrier Relaxation in a-Si:H/a-Sic:H Multilayers Studied by Picosecond Transient Reflectometry;physica status solidi (b);1995-08-01
4. Depth microscopy at interfaces;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03
5. Diffusion Lengths in a-Si:H/a-Sic:H and a-Si:H/a-Sige:H Multilayers Determined by the Grating Method;MRS Proceedings;1994
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