DEFECT CONTROL IN ORGANIC CRYSTALS-Reference-Cited by-同舟云学术

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DEFECT CONTROL IN ORGANIC CRYSTALS

Published:1990 Issue: Volume: Page:1611-1621
ISSN:
Container-title:Defect Control in Semiconductors
language:
Short-container-title:

Author:

SHERWOOD John N.

Publisher

Elsevier

Reference24 articles.

1. Advanced Crystal Growth;McArdle,1987

2. Comparison of different methods for the detection of ppm impurities in organic molecular crystals

3. X-ray Diffraction Topography;Tanner,1976

4. Characterisation of Crystal Growth Defects by X-ray Methods : NATO ASI B63;Bowen,1980

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Observation of Clear Images of Dislocations in Protein Crystals by Synchrotron Monochromatic-Beam X-ray Topography;Crystal Growth & Design;2007-11-01

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