Melting of silicon crystals and a possible origin of swirl defects
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference41 articles.
1. Etch Pits Observed in Dislocation-Free Silicon Crystals
2. New X‐Ray Topographic Technique for Detection of Small Defects in Highly Perfect Crystals
3. Topographic observation of micro defects (e.g.`swirls') in nearly perfect crystals
4. VACANCY CLUSTERS IN DISLOCATION‐FREE SILICON
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