Determination of lattice parameter and elastic properties of porous silicon by X-ray diffraction
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics
Reference13 articles.
1. X-ray topographic characterization of porous silicon layers
2. Double-crystal spectrometer measurements of lattice parameters and X-ray topography on heterojunctions GaAs–AlxGa1−xAs
3. Lattice mismatch at the interface in GaP-GaP and GaAIAs-GaAs epitaxial growth
4. X-ray double-crystal diffractometry of Ga1−xAlxAs epitaxial layers
5. Precision lattice constant determination
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