Subject
Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. Processing high purity silicon for sensor applications;ten Kate;Sensor and Actuators,1989
2. Reverse bias voltage decay measurement of the dark current in semiconductor radiation detectors;Totterdell;Solid-State Electron.,1987
3. Recombination lifetime using the pulsed MOS capacitor;Schroder;IEEE Trans. Electron Devices,1984
4. Effective lifetimes in high quality silicon devices;Schroder;Solid-State Electron.,1984
5. A microwave method for contactless measurement of the life-time of free carriers in silicon;Otaredian;J. Phys. (Paris) Colloq.,1988
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献