Detailed structural analysis of Ce doped Si thin films-Reference-Cited by-同舟云学术

Detailed structural analysis of Ce doped Si thin films

Published:2001-05 Issue:1-3 Volume:10 Page:237-241
ISSN:1386-9477
Container-title:Physica E: Low-dimensional Systems and Nanostructures
language:en
Short-container-title:Physica E: Low-dimensional Systems and Nanostructures

Author:

Yokota T,Fujimura N,Morinaga Y,Ito T

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. N. Fujimura, Y. Morinaga, H. Tomita, T. Ito, J. Appl. Phys., submitted for publication.

2. N. Fujimura, Y. Morinaga, T. Yokota, T. Ito, Extended abstract, The Fourth Symposium on the Physics and Application of spin-Related Phenomena in Semiconductors, 1998, pp. 105, 112.

3. T. Yokota, N. Fujimura, Y. Morinaga, T. Ito, Extended abstract, The Fourth Symposium on the Physics and Application of spin-Related Phenomena in Semiconductors, 1998, p. 115.

4. N. Fujimura, T. Yokota, Y. Morinaga, T. Ito, Extended abstract, The Fifth Symposium on the Physics and Application of spin-Related Phenomena in Semiconductors, 1999, p. 125.

5. E.H. Putley, The Hall Effect and Semi-conductor Physics, Dover publications, Inc., New York, 1960, p. 25.

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