State of the art in the semiconductor detectors

Author:

Rehak P.,Gatti E.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Exploring the limits of EDS microanalysis: rare earth element analyses;IOP Conference Series: Materials Science and Engineering;2018-01

2. Introduction;Series in Sensors;2013-11-06

3. Conception and design criteria of a novel silicon device for the measurement of position and energy of X-rays;IEEE Transactions on Nuclear Science;1997-10

4. Silicon devices for low-energy X-ray detection: Comparison between the charge-coupled device and the semiconductor drift chamber;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1997-10

5. Knock-on electrons in WA98 silicon drift detector;Czechoslovak Journal of Physics;1997

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