Analysis of X-ray images and spectra (aXis2000): A toolkit for the analysis of X-ray spectromicroscopy data

Author:

Hitchcock Adam P.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference48 articles.

1. 〈https://en.wikipedia.org/wiki/IDL_(programming_language)〉 (accessed 17-Apr-2023).

2. Soft X-rays And Extreme Ultraviolet Radiation;Attwood,1999

3. Soft X-ray Spectroscopy from Image Sequences with Sub-100 nm Spatial Resolution;Jacobsen;J. Microsc.,2000

4. NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space;Ade;Polymer,2008

5. Soft X-ray spectromicroscopy and ptychography;Hitchcock;J. Electron Spectrosc. Relat. Phenom.,2015

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