XPS characterization of a plasmonic sensor for catalysis studies by controlled differential charging

Author:

Bergman Susanna L.,Ganguly Aahana S.,Bernasek Steven L.

Funder

National Science Foundation Division of Materials Research

Division of Chemistry

National Science Foundation Princeton MRSEC

Princeton Institute for the Science and Technology of Materials

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference28 articles.

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2. Differential charging in SiO2/Si system As determined by XPS;Karadas;J. Phys. Chem. B,2004

3. Use of the differential charging effect in XPS to determine the nature of surface compounds resulting from the interaction of a model catalyst with SOx;Smirnov;Kinet. Catal.,2011

4. Differentiation of domains in surface structures by charge-Contrast X-ray photoelectron spectroscopy;Suzer;Anal. Chem.,2007

5. Differential charging in X-ray photoelectron Spectroscopy:A nuisance or a useful tool?;Suzer;Anal. Chem.,2003

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