Electron energy loss spectroscopy for quantitative analysis of the local atomic structure of superthin oxide films on the surface of 3d-metals

Author:

Guy D.,Bakieva O.,Grebennikov V.,Surnin D.,Ruts Y.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. Structural determination of crystalline silicon by extended energy-loss fine-structure spectroscopy

2. CarbonKEdge in Graphite Measured Using Electron-Energy-Loss Spectroscopy

3. Theoretical approaches to x-ray absorption fine structure

4. A.L. Ageev, N.V. Yershov, V.R. Shvetcov, Yu.A. Babanov, V.V. Vasin, The Length of Chemical Bond. The Programs of the Treating of XPS-Data, RAS, Ural Academical Center, Institute of Mathematical and Mechanical, Sverdlovsk, 1987, 87p.

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