New method for the determination of the correction function of a hemisperical electron analyser based on elastic electron images-Reference-Cited by-同舟云学术

New method for the determination of the correction function of a hemisperical electron analyser based on elastic electron images

Published:2014-12 Issue: Volume:197 Page:80-87
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Mahjoub Mohamed Aymen,Monier Guillaume,Robert-Goumet Christine,Bideux Luc,Gruzza Bernard

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference28 articles.

1. Instrumentation for surface studies: XPS angular distributions

2. Quantitative analysis of XPS intensities for supported catalysts

3. Methods for quantitative analysis in XPS and AES

4. Formalism and parameters for quantitative surface analysis by Auger electron spectroscopy and x-ray photoelectron spectroscopy

5. Channel electron multipliers: quantitative intensity measurement—efficiency, gain, linearity and bias effects

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