Monte Carlo analysis of electronic noise in semiconductor materials and devices-Reference-Cited by-同舟云学术

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Monte Carlo analysis of electronic noise in semiconductor materials and devices

Published:1997-02 Issue:2 Volume:28 Page:183-198
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Reggiani L.,Golinelli P.,Varani L.,González T.,Pardo D.,Starikov E.,Shiktorov P.,Gružinskis V.

Publisher

Elsevier BV

Subject

General Engineering

Reference74 articles.

1. Proceedings of the 6th Int. Conf. on Noise in Physical Systems and 1/f Noise,1981

2. Proceedings of the 7th Int. Conf. on Noise in Physical Systems and 1/f Noise,1983

3. Proceedings of the 8th Int. Conf. on Noise in Physical Systems and 1/f Noise,1985

4. Proceedings of the 9th Int. Conf. on Noise in Physical Systems and 1/f Noise,1987

5. Proceedings of the 10th Int. Conf. on Noise in Physical Systems and 1/f Noise,1989

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-field charge transport and noise in p -Si from first principles;Physical Review B;2023-01-05

2. Dark current and 1/f noise characteristics of In0.74Ga0.26As photodiode passivated by SiNx/Al2O3 bilayer;Infrared Physics & Technology;2020-09

3. Monte Carlo modelling of Schottky diode for rectenna simulation;Solid-State Electronics;2017-09

4. Electron dynamical response in InP semiconductors driven by fluctuating electric fields;Chaos, Solitons & Fractals;2015-12

5. Monte-Carlo study of electron noise in compensated InSb;Physica Scripta;2014-12-04

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