Model-based clustering for integrated circuit yield enhancement-Reference-Cited by-同舟云学术

Model-based clustering for integrated circuit yield enhancement

Published:2007-04 Issue:1 Volume:178 Page:143-153
ISSN:0377-2217
Container-title:European Journal of Operational Research
language:en
Short-container-title:European Journal of Operational Research

Author:

Hwang Jung Yoon,Kuo Way

Publisher

Elsevier BV

Subject

Information Systems and Management,Management Science and Operations Research,Modelling and Simulation,General Computer Science,Industrial and Manufacturing Engineering

Reference29 articles.

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