Low-temperature silicon crystallization mediated by copper suicide formation in Cu/a-Si: H bilayers
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference19 articles.
1. In situcrystallization of amorphous silicon in the transmission electron microscope
2. Chaneling effect measurements of the recrystallization of amorphous Si layers on crystal Si
3. Induced crystallization of amorphous silicon film in contact with aluminium
4. Crystallization of silicon in aluminium/amorphous-silicon multilayers
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