Raman microprobe: a non-destructive tool for studying local misorientations in GaAs
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference16 articles.
1. Growth peculiarities of gallium arsenide single crystals
2. Dislocation-free GaAs by the liquid encapsulation technique
3. Stacking fault energy and ionicity of cubic III–V compounds
4. High resolution electron microscopy and etching study of twins in GaAs
5. Atomic structure of twins in GaAs
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