Author:
Wang W.L.,Whitehouse D.J.
Reference10 articles.
1. The measurement of surface roughness and profiles on metals;Quiney;Trans ASLE,1967
2. An SEM study of surface roughness measurement;Turker,1969
3. Stylus tracer resolution and surface damage as determined by scanning electron microscopy;Guerrero;J Eng Industry,1972
4. Dynamic aspects of scanning surface instruments and microscopes;Whitehouse;Nanotechnology,1990
5. A revised philosophy of surface measuring systems;Whitehouse,1988
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献