Verification of a polarization-insensitive optical interferometer system with subnanometric capability-Reference-Cited by-同舟云学术

Verification of a polarization-insensitive optical interferometer system with subnanometric capability

Published:1995-04 Issue:2 Volume:17 Page:84-88
ISSN:0141-6359
Container-title:Precision Engineering
language:en
Short-container-title:Precision Engineering

Author:

Downs M.J.,Birch K.P.,Cox M.G.,Nunn J.W.

Publisher

Elsevier BV

Subject

General Engineering

Reference12 articles.

1. A proposed design for a polarization-insensitive optical interferometer system with subnanometric capability;Downs;Prec Eng,1993

2. A proposed design for an optical interferometer with subnanometric resolution;Downs;Nanotechnology,1990

3. Optical sources of non-lienarity in heterodyne interferometers;Rosenbluth;Prec Eng,1990

4. Oldham, N. M., Kramar, J. A., Hetrik, P. S. and Teague, E. C. “Electronic limitation in phase meters for heterodyne interferometry,” NIST, Gaithersburg, MD, U.S. Dept. of Commerce, Technology, Administration

5. Linear interpolation of periodic error in a heterodyne laser interferometer at subnanometre levels;Tanaka;IEEE Trans on Instru and Meas,1989

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