Author:
Abadir M.S.,Reghbati H.K.
Subject
Computational Mathematics,Computational Theory and Mathematics,Modelling and Simulation
Reference18 articles.
1. Functional test generation for digital circuits described using binary decision diagrams;Abadir;IEEE Trans. Comput.,1986
2. VLSI Testing and Validation Techniques;Reghbati,1985
3. Functional specification and testing of logic circuits;Abadir;Comput. Math. Applic.,1985
4. Binary decision diagram;Akers;IEEE Trans. Comput.,1978
5. Functional testing with binary decision diagram;Akers,1978
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1 articles.
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