Effect of manufacturing technics on the microstructure and temperature-affected electrical performance of D-type latch devices-Reference-Cited by-同舟云学术

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Effect of manufacturing technics on the microstructure and temperature-affected electrical performance of D-type latch devices

Published:2020-05 Issue: Volume:99 Page:104757
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Ma Yong,Yu Yongjian,Lu Jian,Zou Qiaoyun,Zhang Huibin

Funder

Department of Detection Business, the 58th Research Institute of China Electronics Technology Group Corporation

Publisher

Elsevier BV

Subject

General Engineering

Reference45 articles.

1. Symmetric self-electro-optic effect device: optical set-reset latch;Lentine;Appl. Phys. Lett.,1988

2. A single event upset tolerant latch design;Wang;Microelectron. Reliab.,2018

3. A memristor-based nonvolatile latch circuit;Robinett;Nanotechnology,2010

4. A novel SR latch device realized by integration of three-terminal ballistic junctions in InGaAs/InP;Sun;IEEE Electron. Device Lett.,2008

5. Reversible logic-based concurrently testable latches for molecular QCA;Thapliyal;IEEE Trans. Nanotechnol.,2009

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1. Process optimization for enhancing interconnect performance of large-size BGA component during vibration loading;Microelectronics Journal;2022-03

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