Change of surface oxide layer of pyrite samples prepared by resin embedding polishing method after long-term placement and its effect on TOF-SIMS analysis-Reference-Cited by-同舟云学术

Change of surface oxide layer of pyrite samples prepared by resin embedding polishing method after long-term placement and its effect on TOF-SIMS analysis

Published:2024-03 Issue: Volume:46 Page:104124
ISSN:2468-0230
Container-title:Surfaces and Interfaces
language:en
Short-container-title:Surfaces and Interfaces

Author:

Xu Ziqi^ORCID,Li Shan,Guo Chong,Li Zhanping^ORCID,Liang Handong

Publisher

Elsevier BV

Reference43 articles.

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3. Gold-telluride nanoparticles revealed in arsenic-free pyrite;Ciobanu;Am. Mineral.,2012

4. Minor and trace elements in bornite and associated Cu–(Fe)-sulfides: a LA-ICP-MS studyBornite mineral chemistry;Cook;Geochim. Cosmochim. Acta,2011

5. In-situ LA-(MC)-ICPMS and (Nano)SIMS trace elements and sulfur isotope analyses on sulfides and application to confine metallogenic process of ore deposit;Fan;Acta Petrol Sin.,2018

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1. Corrigendum to ‘Change of surface oxide layer of pyrite samples prepared by resin embedding polishing method after long-term placement and its effect on TOF-SIMS analysis’ Surfaces and Interfaces volume 46 (2024) 104124;Surfaces and Interfaces;2024-07