Porosity and thickness characterization of porous Si and oxidized porous Si layers – An ultraviolet–visible–mid infrared ellipsometry study-Reference-Cited by-同舟云学术

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Porosity and thickness characterization of porous Si and oxidized porous Si layers – An ultraviolet–visible–mid infrared ellipsometry study

Published:2016-06 Issue: Volume:227 Page:112-120
ISSN:1387-1811
Container-title:Microporous and Mesoporous Materials
language:en
Short-container-title:Microporous and Mesoporous Materials

Author:

Fodor Balint^ORCID,Agocs Emil,Bardet Benjamin,Defforge Thomas,Cayrel Frederic,Alquier Daniel,Fried Miklos,Gautier Gael,Petrik Peter

Funder

National Development Agency grants

OTKA grant

ENIAC E450EDL project

Hungarian–French Intergovernmental S&T Cooperation Programme

Publisher

Elsevier BV

Subject

Mechanics of Materials,Condensed Matter Physics,General Materials Science,General Chemistry

Reference36 articles.

1. Electrochemical stabilization of porous silicon multilayers for sensing various chemical compounds

2. Mesoporous silicon negative electrode for thin film lithium-ion microbatteries

3. Electron Devices;Capelle;IEEE Trans.,2011

4. Porous silicon for electrical isolation in radio frequency devices: A review

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