AFM imaging and fractal analysis of surface roughness of AlN epilayers on sapphire substrates
Author:
Funder
European Centre of Excellence
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference28 articles.
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3. Magnetron sputter deposition of (SiC)1−x(AlN)x solid solution films;Guseinov;Tech. Phys. Lett.,2005
4. Structural properties of Al2O3/AlN thin film prepared by magnetron sputtering of Al in HF-activated nitrogen plasma;Dallaeva;Thin Solid Films,2012
5. Dry etching of thin-film InN, AIN and GaN;Pearton;Semicond. Sci. Technol.,1993
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