Double Gaussian distribution of barrier height for FeCrNiC alloy Schottky contacts on p-Si substrates
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference35 articles.
1. Metal–Semiconductor Contacts;Rhoderick,1988
2. Physics of Semiconductor Devices;Sze,1981
3. Theoretical study of the temperature dependence of electrical characteristics of Schottky diodes with an inverse near-surface layer;Osvald;Appl. Surf. Sci.,2004
4. Evidence for the double distribution of barrier heights in Schottky diodes from I–V–T measurements;Chand;Semicond. Sci. Technol.,1996
5. On the inhomogeneity of Schottky barriers;Tung;Mater. Sci. Eng. B,1992
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