Towards quantitative chemical imaging with ToF-SIMS
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference34 articles.
1. Imaging with Mass Spectrometry
2. ToF-SIMS: Surface Analysis by Mass Spectrometry;Tyler,2001
3. Denoising and multivariate analysis of time-of-flight SIMS images
4. De-noising of SIMS images via wavelet shrinkage
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1. Framework for alternating-least-squares-based multivariate curve resolution with application to time-of-flight secondary ion mass spectrometry imaging;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2015-09
2. Quantitative imaging of trace B in Si and SiO2 using ToF-SIMS;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2015-09
3. Imaging Mass Spectrometry in Neuroscience;ACS Chemical Neuroscience;2013-04-30
4. Surface and Thin Film Analysis;Nonthermal Plasma Chemistry and Physics;2012-11-13
5. An image formation model for Secondary Ion Mass Spectrometry imaging of biological tissue samples;Applied Surface Science;2010-12
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