A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions-Reference-Cited by-同舟云学术

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A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions

Published:2008-12 Issue:4 Volume:255 Page:1588-1590
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Ninomiya Satoshi,Nakata Yoshihiko,Honda Yoshiro,Ichiki Kazuya,Seki Toshio,Aoki Takaaki,Matsuo Jiro

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference13 articles.

1. Proc. Second Japan-China Joint Symp. on Mass Spectrometry;Tanaka,1987

2. Electrospray Ionization for Mass Spectrometry of Large Biomolecules

3. Analysis of Submonolayers on Silver by Negative Secondary Ion Emission

4. A C60 Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry: Its Development and Secondary Ion Yield Characteristics

5. Tissue Molecular Ion Imaging by Gold Cluster Ion Bombardment

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