Optical constants and thickness determination of La<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si187.svg" display="inline" id="d1e1363"><mml:msub><mml:mrow/><mml:mrow><mml:mn>2</mml:mn><mml:mo>/</mml:mo><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:math>Sr<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si188.svg" display="inline" id="d1e1375"><mml:msub><mml:mrow/><mml:mrow><mml:mn>1</mml:mn><mml:mo>/</mml:mo><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:math>MnO3 thin films on Nb:SrTiO3 substrates by spectro-ellipsometry: Combination of optical and X-ray techniques-Reference-Cited by-同舟云学术

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Optical constants and thickness determination of La2/3Sr1/3MnO3 thin films on Nb:SrTiO3 substrates by spectro-ellipsometry: Combination of optical and X-ray techniques

Published:2024-10 Issue: Volume:669 Page:160489
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Blond Jérémy^ORCID,Dufour Christian,Chaluvadi Sandeep Kumar^ORCID,Duprey Sylvain,Portier Xavier,Marie Philippe,Pierron Victor,Méchin Laurence^ORCID,Guillet Bruno^ORCID

Funder

Université de Caen Normandie

Agence Nationale de la Recherche

Publisher

Elsevier BV

Reference38 articles.

1. Epitaxial diodes of a half-metallic ferromagnet on an oxide semiconductor;Postma;J. Appl. Phys.,2004

2. High-quality all-oxide Schottky junctions fabricated on heavily Nb-doped SrTiO3 substrates;Ruotolo;Phys. Rev. B,2007

3. Good rectifying characteristic in p–n junctions composed of La 0.67 Ca 0.33 MnO 3- δ/Nb–0.7 wt%-doped SrTiO 3;Hu;Appl. Phys. Lett.,2003

4. Ultrathin junctions based on the LaSrMnO3/Nb:SrTiO3 functional oxide interface;Kurij;Thin Solid Films,2016

5. Photovoltaic characteristic of La0.7Sr0.3MnO3/ZnO p-n heterojunction;Zhi-Hui;Chin. Phys. Lett.,2008

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