Analysis of extended X-ray absorption fine structure (EXAFS) data using artificial intelligence techniques-Reference-Cited by-同舟云学术

Analysis of extended X-ray absorption fine structure (EXAFS) data using artificial intelligence techniques

Published:2021-05 Issue: Volume:547 Page:149059
ISSN:0169-4332
Container-title:Applied Surface Science
language:en
Short-container-title:Applied Surface Science

Author:

Terry Jeff,Lau Miu Lun,Sun Jiateng,Xu Chang,Hendricks Bryan,Kise Julia,Lnu Mrinalini,Bagade Sanchayni,Shah Shail,Makhijani Priyanka,Karantha Adithya,Boltz Travis,Oellien Max,Adas Matthew,Argamon Shlomo,Long Min,Guillen Donna Post

Funder

US Department of Energy

Publisher

Elsevier BV

Subject

Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry

Reference46 articles.

1. Proliferation of Faulty Materials Data Analysis in the Literature

2. Supervised Machine-Learning-Based Determination of Three-Dimensional Structure of Metallic Nanoparticles

3. New methods for EXAFS analysis in structural genomics

4. Ab Initio Self-Consistent X-Ray Absorption Fine Structure Analysis for Metalloproteins

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