Author:
Powell C.J.,Jablonski A.,Werner W.S.M.,Smekal W.
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference25 articles.
1. C.J. Powell, A. Jablonski, NIST Electron Effective-Attenuation-Length Database, Version 1.1, Standard Reference Data Program Database 82, National Institute of Standards and Technology, Gaithersburg, 2003 (http://www.nist.gov/srd/nist82.htm).
2. W.S.M. Werner, W. Smekal, C.J. Powell, NIST Database for Simulation of Electron Spectra for Surface Analysis (in preparation).
3. Electron effective attenuation lengths for applications in Auger electron spectroscopy and x-ray photoelectron spectroscopy
4. The electron attenuation length revisited
5. Escape probability of signal photoelectrons from non-crystalline solids: influence of anisotropy of photoemission
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