Author:
Conard T.,Vandervorst W.,De Witte H.,Van Elshocht S.
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Surfaces and Interfaces,General Physics and Astronomy,General Chemistry
Reference7 articles.
1. H. De Witte, T. Conard, W. Vandervorst, R. Gijbels, in: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry—SIMS XII, 5–10 September 1999, Brussel, Belgium, Elsevier, Amsterdam, 2000, pp. 611–614.
2. SIMS analysis of oxynitrides: evidence for nitrogen diffusion induced by oxygen flooding;De Witte;Surf. Interf. Anal.,2000
3. T. Conard, H. De Witte, M. Schaekers, W. Vandervorst, in: Proceedings of the 12th International Conference on Secondary Ion Mass Spectrometry—SIMS XII, 5–10 September 1999, Brussel, Belgium, 2000, Elsevier, Amsterdam, pp. 381–384.
4. T. Wirtz, H.-N. Migeon, in: Proceedings of the SIMS XIV, San Diego, USA, 14–19 September 2003.
5. T. Conard, C. Huyghebaert, W. Vandervorst, in: Proceedings of the SIMS XIV, vol. 231–232, San Diego, USA, 2004, pp. 603–608.
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