Oxidation of clean silicon surfaces studied by four-point probe surface conductance measurements
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference9 articles.
1. Kinetics of the adsorption of atomic oxygen (N2O) on the Si(001)2 × 1 surface as revealed by the change in the surface conductance
2. CORRELATION BETWEEN ATOMIC-SCALE STRUCTURES AND MACROSCOPIC ELECTRICAL PROPERTIES OF METAL-COVERED Si(111) SURFACES
3. Measurement of Sheet Resistivities with the Four-Point Probe
4. Surface roughness and conductivity of thin Ag films
5. On the electronic structure of clean, 2×1 reconstructed silicon (001) surfaces
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