Origin, modeling and suppression of grinding marks in ultra precision grinding of silicon wafers

Author:

Huo F.W.,Kang R.K.,Li Z.,Guo D.M.

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Mechanical Engineering

Reference26 articles.

1. Present status and prospect of Si wafers for ultra large scale integration;Tsuya;Japan Journal of Applied Physics,2004

2. Mike Seacrist, Silicon starting materials for sub-65nm technology nodes, in: 9th International Symposium on Wafer Cleaning and Surface Preparation, June 8–9, 2005, Boise, Idaho, USA.

3. International Technology Roadmap for Semiconductors 2009 Edition, Front End Processes, 〈http://www.itrs.net〉.

4. Recent advances in machining of silicon wafers for semiconductor applications;Sreejith;International Journal of Advanced Manufacturing Technology,2001

5. A study on surface grinding of 300mm silicon wafers;Pei;International Journal of Machine Tools and Manufacture,2002

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