Author:
Dupuis Thomas,Chêne G.,Mathis F.,Marchal A.,Philippe M.,Garnir H.-P.,Strivay D.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
10 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. RBS
and
PIXE
data analysis by two dimensional correlation mapping techniques: On the effects of ion irradiation and sulfonation on poly(ether ether ketone) membranes;X-Ray Spectrometry;2020-10-22
2. High energy PIXE: A tool to characterize multi-layer thick samples;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2018-02
3. Thick multi-layers analysis using high energy PIXE;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-09
4. K-, L- and M-shell X-ray productions induced by krypton ions in the 0.8–1.6 MeV/amu range;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-09
5. Standardless semi-quantitative analysis by PIXE;Journal of Analytical Atomic Spectrometry;2017