CdTe detector use for PIXE characterization of TbCoFe thin films-Reference-Cited by-同舟云学术

CdTe detector use for PIXE characterization of TbCoFe thin films

Published:2010-06 Issue:11-12 Volume:268 Page:2010-2014
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Chaves P.C.,Taborda A.,Barradas N.P.,Reis M.A.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference21 articles.

1. P.C. Chaves, O.R. Oliveira, V. Corregidor, N. Barradas, O. Vigil Galán, A. Arias Carbajal, M.A. Reis, CdTe detector use in PIXE characterization of Sn dopped CdO thin films, in: M. Budnar, M. Kavcic (Eds.), Proceedings of the 10th International Conference on Particle Induced X-ray Emission and Its Analytical Application, 4 a 8 Junho, 2004, Portoroz – Slovenia (CD-Edition).

2. M.A. Reis, P.C. Chaves, V. Corregidor, N. Barradas, E. Alves F. Dimroth, A. Bett, Grazing detection geometry for PIXE characterization of thin films, in: M. Budnar, M. Kavcic (Eds.), Proceedings of the 10th International Conference on Particle Induced X-ray Emission and Its Analytical Application, 4 a 8 Junho, 2004, Portoroz – Slovenia (CD-Edition).

3. M.A. Reis, N.P. Barradas, C. Pascual-Izarra, P.C. Chaves, A.R. Ramos, E. Alves, G. González-Aguilar, M.E.V. Costa, Holistic RBS–PIXE data reanalysis of SBT thin film samples, in: Proceedings of the 19th International Conference on the Application of Accelerators in Research and Industry, August 20–25, Fort Worth, Texas, USA, 2006, Nucl. Inst. Meth. Phys. Rev. B 261 (2007) 439–442.

4. Detection angle resolved PIXE and the equivalent depth concept for thin films characterization;Reis;X-Ray Spectrom.,2005

5. V. Corregidor, N.P. Barradas, E. Alves, N. Franco, L.C. Alves, P.C. Chaves, M.A. Reis, Ion beam analysis of GaInAsSb films grown by MOVPE on GaSb, in: Proceedings of the 18th International Conference on the Application of Accelerators in Research and Industry, Nucl. Inst. Meth. Phys. Rev B (2005) 326–330.

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