Author:
Fizzotti F.,Colombo E.,Lo Giudice A.,Manfredotti C.,Medunic Z.,Jaksic M.,Vittone E.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
11 articles.
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1. Polychromatic angle resolved IBIC analysis of silicon power diodes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2021-02
2. Investigation of ion beam induced radiation damage in Si PN diodes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-07
3. Semiconductor Characterization by Scanning Ion Beam Induced Charge (IBIC) Microscopy;ISRN Materials Science;2013-01-17
4. Radiation Effects Microscopy;Characterization of Materials;2012-10-12
5. Effects of Fluences of Irradiation with 107 MeV Krypton Ions on the Recovery Charge of Silicon p+n-Diodes;Acta Physica Polonica A;2011-07