Background-free beta-decay half-life measurements by in-trap decay and high-resolution MR-ToF mass analysis-Reference-Cited by-同舟云学术

Background-free beta-decay half-life measurements by in-trap decay and high-resolution MR-ToF mass analysis

Published:2016-06 Issue: Volume:376 Page:275-280
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Wolf R.N.,Atanasov D.,Blaum K.,Kreim S.,Lunney D.,Manea V.,Rosenbusch M.,Schweikhard L.,Welker A.,Wienholtz F.,Zuber K.

Funder

BMBF

ENSAR

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference56 articles.

5. 100 years of mass spectrometry;Blaum;Int. J. Mass Spectrom.,2013

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