Monte Carlo study of ion-induced backward and forward secondary electron emission from thin Al foil
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference24 articles.
1. Direct and recoil-induced electron emission from ion-bombarded solids
2. Electron emission from ion‐bombarded aluminum
3. Projectile- and charge-state-dependent electron yields from ion penetration of solids as a probe of preequilibrium stopping power
4. Influence of the target thickness on the backward and forward electron emission characteristics induced by protons incident on thin carbon foils
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2. Monte Carlo simulations of secondary electron emission due to ion beam milling;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2017-07
3. A comparison on absorption coefficients for secondary electron emission obtained from two different formulas;Moscow University Physics Bulletin;2016-07
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