Secondary neutral and ionized particle measurements under MeV-energy ion bombardment-Reference-Cited by-同舟云学术

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Secondary neutral and ionized particle measurements under MeV-energy ion bombardment

Published:2005-04 Issue:1-4 Volume:230 Page:489-494
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Nakata Yoshihiko,Ninomiya Satoshi,Imada Chikage,Nagai Masafumi,Aoki Takaaki,Matsuo Jiro,Imanishi Nobutsugu

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference18 articles.

1. Li+ secondary ion energy distributions probed by fast N2+ and Nq+ bombardment of LiF

2. Enhanced secondary-ion emission under gold-cluster bombardment with energies from keV to MeV per atom

3. Nonlinear effects in desorption of valine with fast incident molecular ions

4. Electronic excitation effects on secondary ion emission in highly charged ion–solid interaction

5. Cluster ion emission in the interaction of slow highly charged ions with surfaces

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Sputtering of GaAs target under Bi+ cluster ions bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2022-10

2. Secondary ion emission from bio-molecular thin films under ion bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-03

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