A new time-of-flight instrument for quantitative surface analysis
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference15 articles.
1. Relative sensitivity factors for positive atomic and molecular ions sputtered from Si and GaAs
2. Fundamental aspects of SNMS for thin film characterization: experimental studies and computer simulations
3. ToF-SIMS: Surface Analysis by Mass Spectrometry;Pellin,2001
4. ToF-SIMS: Surface Analysis by Mass Spectrometry;Wucher,2001
5. Overcoming Genesis mission design challenges
Cited by 27 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The LMS-GT instrument – a new perspective for quantification with the LIMS-TOF measurement technique;Journal of Analytical Atomic Spectrometry;2019
2. Development of an ion guide device in orthogonal acceleration time-of-flight mass spectrometer coupled with laser resonance ionization source;International Journal of Mass Spectrometry;2018-11
3. High Useful Yield and Isotopic Analysis of Uranium by Resonance Ionization Mass Spectrometry;Analytical Chemistry;2017-05-24
4. CHILI – the Chicago Instrument for Laser Ionization – a new tool for isotope measurements in cosmochemistry;International Journal of Mass Spectrometry;2016-08
5. Laser Desorption Postionization Mass Spectrometry Imaging of Biological Targets;Methods in Molecular Biology;2014-10-17
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3