PIXE depth profiling using variation of detection angle
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference19 articles.
1. PIXE: A Novel Technique for Elemental Analysis;Johansson,1988
2. Low energy PIXE: advantages, drawbacks, and applications
3. Concentration profile determination by pixe analysis utilizing the variation of beam energy
4. Evaluation of depth profiling with PIXE
5. Application of a new algorithm to depth profiling by PIXE
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