Scanning X-ray microfluorescence in a SEM for the analysis of very thin overlayers-Reference-Cited by-同舟云学术

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Scanning X-ray microfluorescence in a SEM for the analysis of very thin overlayers

Published:2007-07 Issue:2 Volume:260 Page:628-632
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Valamontes E.S.,Statharas J.C.,Nomicos C.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference19 articles.

1. L.M. Middleman, J.D. Geller, in: Scanning Electron Microscopy, Chicago, 1976, p. 171.

2. Comparison of x-ray elemental analysis by electron excitation and x-ray fluorescence

3. M. Wendt, Patentschrift DD-WP139, 1978, p. 304.

4. M. Wendt, T. Krajewski, in: Proceedings of 5 Tagung Microsonde, Physikalische der DDR, Leipzig, 1981, p. 125.

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