Author:
Jakob A.M.,Spemann D.,Thies R.,Barzola-Quiquia J.,Vogt J.,Butz T.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
3 articles.
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1. Ion Beam Induced Charge analysis of diamond diodes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-08
2. Semiconductor Characterization by Scanning Ion Beam Induced Charge (IBIC) Microscopy;ISRN Materials Science;2013-01-17
3. Radiation Effects Microscopy;Characterization of Materials;2012-10-12