Lot sizing with random yields and tardiness costs-Reference-Cited by-同舟云学术

Lot sizing with random yields and tardiness costs

Published:2000-04 Issue:5 Volume:27 Page:437-459
ISSN:0305-0548
Container-title:Computers & Operations Research
language:en
Short-container-title:Computers & Operations Research

Author:

Agnihothri Sal,Lee Ji Soo,Kim Jeongseob

Publisher

Elsevier BV

Subject

Management Science and Operations Research,Modeling and Simulation,General Computer Science

Reference14 articles.

1. Yano CA, Lee HL. Lot sizing with random yields: a review. Operations Research 1995;43(2):311–34.

2. Russell RS, Taylor III BW. Operations management: Focusing on quality and competitiveness. Upper Saddle River, NJ: Prentice-Hall, Inc., 1998:733.

3. Karlin S. One stage models with uncertainty. In: Arrow K, Karlin S, Scarf H, editors. Studies in the mathematical theory of inventory and production. 1958:109–34.

4. Shih W. Optimal inventory policies when stockouts result from defective products. International Journal of Production Research 1980;18(6):677–85.

5. White JA. On absorbing Markov chains and optimum batch production quantities. AIIE Transactions 1970;2(1):82–7.

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