Chemical elaboration of well defined Cu(In,Ga)Se2 surfaces after aqueous oxidation etching
Author:
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Reference12 articles.
1. Cu(In,Ga)Se2 thin-film solar cells with an efficiency of 18%
2. 18% Efficiency Cd-Free Cu(In, Ga)Se2 Thin-Film Solar Cells Fabricated Using Chemical Bath Deposition (CBD)-ZnS Buffer Layers
3. Progress toward 20% efficiency in Cu(In,Ga)Se2 polycrystalline thin-film solar cells
4. Preferred Orientation Control of Cu(In1-xGax)Se2(x≈0.28) Thin Films and Its Influence on Solar Cell Characteristics
5. CIS-based thin-film photovoltaic modules: potential and prospects
Cited by 38 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. In‐Depth Compositional Analysis of the Carbon‐Rich Fine‐Grain Layer in Solution‐Processed CZTSSe Films Accessed by a Photonic Lift‐Off Process;Advanced Materials Interfaces;2023-12-04
2. On the role of sodium and copper off‐stoichiometry in Cu (In,Ga)S2 for photovoltaic applications: Insights from the investigation of more than 500 samples;Progress in Photovoltaics: Research and Applications;2023-05-03
3. 2‐step process for 5.4% CuGaSe 2 solar cell using fluorine doped tin oxide transparent back contacts;Progress in Photovoltaics: Research and Applications;2022-12-13
4. Does Sb2Se3 Admit Nonstoichiometric Conditions? How Modifying the Overall Se Content Affects the Structural, Optical, and Optoelectronic Properties of Sb2Se3 Thin Films;ACS Applied Materials & Interfaces;2022-03-01
5. Surface modifications of CIGS absorbers and their effects on performances of CIGS solar cells;Ceramics International;2021-12
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3