In-line Thermography for Reliable Hot Spot Detection and Process Control

Author:

Ramspeck Klaus,Schenk Stefan,Duphorn Denny,Metz Axel,Meixner Michael

Publisher

Elsevier BV

Reference15 articles.

1. O. Breitenstein and M. Langenkamp, “Quantitative local analysis of i-v-characterisitics of solar cells by thermal methods”, Proceedings of the 2nd World Conference on photovoltaic solar energy conversion, Vienna, Austria, 1998, 1382-1385.

2. “Quantitative evaluation of shunts in solar cells by lock-in thermography”;Breitenstein;Progress in Photovoltaics: Research and Applications,2003

3. “Realistic evaluation of power losses in solar cells by using thermographic methods”;Isenberg;Journal of Applied Physics,2004

4. “Series resistance imaging in solar cells by lock-in thermography”;Breitenstein;Progress in Photovoltaics: Research and Applications,2005

5. “Correlation between the spatially resolved solar cell efficiency and carrier lifetime of multicrystalline silicon”;Ramspeck;Journal of Material and Sciene: Materials in Electronics,2008

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