Lifetime Degradation on n-type Wafers with Boron-diffused and SiO2/SiN-passivated Surface-Reference-Cited by-同舟云学术

Lifetime Degradation on n-type Wafers with Boron-diffused and SiO2/SiN-passivated Surface

Published:2014 Issue: Volume:55 Page:280-286
ISSN:1876-6102
Container-title:Energy Procedia
language:en
Short-container-title:Energy Procedia

Author:

Renevier Clémentine,Fourmond Erwann,Forster Maxime,Parola Stéphanie,Le Coz Marine,Picard Erwann

Publisher

Elsevier BV

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