A novel method to determine Ga profile in CIGS thin film compound via focused ion beam modification

Author:

Xue ChaoweiORCID,Spaulding DavidORCID,Duong Anh,Loi Huu-Ha,Parker MagdalenaORCID,Bayman Atiye,Zhang JieORCID

Publisher

Elsevier BV

Subject

General Materials Science

Reference19 articles.

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3. Evaluation of micro- and nanoscale uniformity in all-PVD Cu(In,Ga)Se2 solar cells;Kimball,2014

4. The effects of annealing temperature on CIGS solar cells by sputtering from quaternary target with Se-free post annealing;Zhang;Appl. Surface Sci.,2017

5. Solar cell efficiency tables (Version 53);Green;Progr. Photovolt. Res. Appl.,2019

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