Effects of electron-beam irradiation on structural, electrical, and optical properties of amorphous indium gallium zinc oxide thin films
Author:
Funder
Samsung Display
Publisher
Elsevier BV
Subject
General Physics and Astronomy,General Materials Science
Reference26 articles.
1. Present status of amorphous In–Ga–Zn–O thin-film transistors;Kamiya;Sci. Technol. Adv. Mater.,2010
2. Room-temperature fabrication of transparent flexible thin-film transistors using amorphous oxide semiconductors;Nomura;Nature,2004
3. Thin-film transistor fabricated in single-crystalline transparent oxide semiconductor;Nomura;Science,2003
4. The status and perspectives of metal oxide thin-film transistors for active matrix flexible displays;Jeong;Semicond. Sci. Technol.,2011
5. High-mobility thin-film transistor with amorphous InGaZnO4 channel fabricated by room temperature rf-magnetron sputtering;Yabuta;Appl. Phys. Lett.,2006
Cited by 19 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Method and Application of Surface Modification of Cerium Dioxide;Advanced Engineering Materials;2024-05-31
2. Tuning of charge carriers in Bi2Te3 thin films via swift heavy ion irradiation;Journal of Materials Science: Materials in Electronics;2023-01
3. Structural, thermal, and novel magnetic characteristics of e-beam irradiated PANI/Bi2Te3 composites for tunable applications;Journal of Alloys and Compounds;2022-11
4. Conductometric nitrogen dioxide gas sensors based on sol-gel-prepared hafnium-added indium zinc oxide (Hf-IZO);Sensors and Actuators B: Chemical;2021-10
5. Influence of electron beam irradiation on structural, thermo and photoluminescence properties of SrTiO3:Sm3+ nanophosphor;Optik;2020-12
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3