Reliability through controlled environments and microminiaturization-Reference-Cited by-同舟云学术

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Reliability through controlled environments and microminiaturization

Published:1962-01 Issue:3 Volume:1 Page:189-201
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Dummer G.W.A

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Proc. 1960 Electronic Components Conference;Dummer,1960

2. Radio and Electronic Components;Walker,1961

3. Proc. 6th National Symposium on Reliability and Quality Control;Ferrier,1960

4. Electro-Technology;Dummer,1961

5. Proc. Electronic Components Symposium;Griffin,1959

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Heterocrystals for microelectronics;Microelectronics Reliability;1963-08

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