Terminal reliability using binary decision diagrams-Reference-Cited by-同舟云学术

Terminal reliability using binary decision diagrams

Published:1996-03 Issue:3 Volume:36 Page:363-365
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Singh H.,Vaithilingam S.,Anne R.K.,Anneberg L.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. Reliability in a communication network;Fratta;IEEE Trans. Circuit Theory,1973

2. Binary decision diagrams;Sheldon;IEEE Trans. Comput.,1978

3. Symbolic Boolean manipulation with ordered binary decision diagram;Randal;ACM Comput. Surveys,1992

4. Advances in Distributed System Reliability;Rai,1990

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