Reliability of compound semiconductor devices

Author:

Fantini Fausto,Magistrali Fabrizio

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference91 articles.

1. Reliability and degradation of active III–V semiconductor devices;Davey,1981

2. Reliability and degradataion of lasers and LEDs;Newman,1981

3. The reliability of GaAs FETs;Irvin,1982

4. Report on the 1982 GaAs device reliability workshop;Christou,1982

5. Reliability problems in state-of-the-art GaAs devices and circuits;Christou;Qual. Reliab. Engng Int.,1989

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1. Degradation mechanisms in heterostructure devices and their correlation with defects;Defect Recognition and Image Processing in Semiconductors 1997;2017-11-22

2. Reliability physics of compound semiconductor transistors for microwave applications;Microelectronics Reliability;2001-01

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